Institute of Materials Science

Faculty of Computer Science and Materials Science

Department of Crystallography

75 Pułku Piechoty 1A Str.
41-500 Chorzów, Poland
tel. (+48) 32 3497 515

 

 

Head of Department: dr hab. Włodzimierz Bogdanowicz 
e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
room: H/2/13
tel. (+48) 32 3497 538

 

 

 

Scope of Activities

Scientific activity in the Department of Crystallography is focused on the single-crystalline materials, they characterization and obtaining processes. The investigations concern strict single-crystals,  composites with single-crystalline matrix as well as single-crystalline superalloys, e.g. turbine blades of aircraft engines, composites with quasicrystalline phase fraction or semiconductor silicides.

The studies concentrate on determination of the structural perfection and analysis of growth defects of single-crystalline industrial components in relation to obtaining conditions. Additionally, the precise lattice parameter determination and changes in optical single-crystals (the Bond method) are performed.

 

Research Equipment

  • Multipurpose X-ray diffraction system XRT-100: self-constructed in cooperation with Freiberg Instruments EFG Germany, based on the XRT-100CCM Rigaku diffractometer with rotated anode; capable of non-destructive analysis of defects by X-ray topography method of single-crystals with diameters of up to 10 cm. The XRT-100CCM system has a mechanism for switching the X-ray receiving optics between an X-ray CCD camera (X-ray vision camera), scintillation counter (SC) containing an analyzer crystal or Image Plates (IP). This configuration extends the X-ray topography function by adding the functionality of a high-resolution X-ray diffractometer capable of rocking curve and lattice distortion measurements.
  • PANalytical MicroSource DY-601 X-ray diffractometer, equipped with a microfocus source, emitting a divergent X-ray beam, coupled with an Auleytner camera for defects analysis by topography method.
  • Four-test-bench X-ray diffractometer for crystal orientation measurements by Laue method, based on the VEM HV generator.

  • Induction vertical furnace BCG-265 for directional solidification of single-crystalline materials using Bridgman or Czochralski technique.

Research offering

  • Obtaining a bulk single-crystals of metals and their alloys.
  • Obtaining a bulk single-crystalline composites, including composites with quasicrystalline phase fraction and single-quasicrystals
  • Defects structure analysis of single-crystalline materials, including single-crystalline nickel based superalloys, using X-ray diffraction methods of topography (Auleytner geometry) and Laue.
  • Precise measurements of lattice parameters using the Bond technique.

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